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ICAN Notes

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2021
- Angle Resolved XPS - ARXPS
  
  Hagemann, Ulrich
- Focus Track – How to minimize and compensate z-Axis drift using the Renishaw InVia Raman microscope
  
  Hagemann, Ulrich
- The ultramicrotome as a tool for the preparation of ultra-thin samples for TEM investigations
  
  Nguyen, Thai Binh; Heidelmann, Markus
2020
- High-Angle Annular Dark-Field (HAADF) Contrast
  
  Heidelmann, Markus
- The matrix effect - A challenge for quantitative secondary ion mass spectrometry
  
  Hartmann, Nils

Category

Issuing body:: ICAN - Interdisciplinary Center for Analytics on the Nanoscale
DOI:: 10.17185/duepublico/73298
Language:: English
Type of Resource:: Text
Subject categories of the Deutsche Nationalbibliografie:: 620 Engineering & allied operations
Hosting institution:: Scientific institutes, Center for Nanointegration Duisburg-Essen (CENIDE), ICAN - Interdisciplinary Center for Analytics on the Nanoscale

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ICAN Notes. Online unter: https://duepublico2.uni-due.de/receive/duepublico_mods_00073298.

10.17185/duepublico/73298
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