Contrast of 83% in reflection measurements on a single quantum dot

Lochner, Pia; Kurzmann, Annika LSF; Schott, Rüdiger; Wieck, Andreas D.; Ludwig, Arne; Lorke, Axel LSF; Geller, Martin Paul LSF

We report on a high optical contrast between the photon emission from a single self-assembled quantum dot (QD) and the back-scattered excitation laser light. In an optimized semiconductor heterostructure with an epitaxially grown gate, an optically-matched layer structure and a distributed Bragg reflector, a record value of 83% is obtained; with tilted laser excitation even 885%. This enables measurements on a single dot without lock-in technique or suppression of the laser background by cross-polarization. These findings open up the possibility to perform simultaneously time-resolved and polarization-dependent resonant optical spectroscopy on a single quantum dot.

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Lochner, Pia / Kurzmann, Annika / Schott, Rüdiger / et al: Contrast of 83% in reflection measurements on a single quantum dot. 2019.

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