Contrast of 83% in reflection measurements on a single quantum dot

Lochner, Pia GND; Kurzmann, Annika GND; Schott, Rüdiger GND; Wieck, Andreas D. GND; Ludwig, Arne GND; Lorke, Axel GND; Geller, Martin GND

We report on a high optical contrast between the photon emission from a single self-assembled quantum dot (QD) and the back-scattered excitation laser light. In an optimized semiconductor heterostructure with an epitaxially grown gate, an optically-matched layer structure and a distributed Bragg reflector, a record value of 83% is obtained; with tilted laser excitation even 885%. This enables measurements on a single dot without lock-in technique or suppression of the laser background by cross-polarization. These findings open up the possibility to perform simultaneously time-resolved and polarization-dependent resonant optical spectroscopy on a single quantum dot.

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Lochner, P., Kurzmann, A., Schott, R., Wieck, A.D., Ludwig, A., Lorke, A., Geller, M.P., 2019. Contrast of 83% in reflection measurements on a single quantum dot. https://doi.org/10.1038/s41598-019-45259-z
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